Abstract
© 2014 IEEE
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© 2014 IEEE
PDF ArticleMichael J. Yadlowsky and Alan R. Mickelson
Appl. Opt. 32(33) 6664-6677 (1993)
Stefan Warm and Klaus Petermann
Opt. Express 21(1) 519-532 (2013)
Norio Kashima
Appl. Opt. 19(15) 2597-2601 (1980)
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