Abstract
A semianalytical study of modal birefringence in weakly strained and
weakly guiding buried-core waveguides is presented. In this paper, modal
birefringence is expressed as a sum of form birefringence and stress
birefringence. Stress birefringence is expressed as an overlap between the
modal field and the stress birefringence distribution. This distribution is
expressed analytically as two constant-value areas to which a spatially
variant stress distribution emanating from the waveguide core is overlaid.
The analysis can be expanded to include the effect of overetching and other
variations that can be defined as mechanical inclusions in the cladding
layer. Expressions for modal birefringence control as a function of material
parameters are given, for the case of square, rectangular, and overetched
waveguides. The conditions for width-independent birefringence control are
identified. Modal birefringence values obtained from the analysis are
compared to those obtained by finite-element analysis for the case of
square, rectangular, and overetched waveguides. The modal birefringence
values are shown to be within 5% of each other for a typical
silica-on-silicon waveguide.
© 2012 Crown
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