Abstract
The spontaneous emission (SE) rate enhancement due to surface plasmon polariton
bandgap effect on copper grating was evaluated by calculating the dispersion relation
and the electromagnetic field distribution simultaneously. Within the frequency range of
silicon nanocrystals (Si-NC) luminescence ($\hbar{\omega}=1.6$eV–1.9 eV), the calculated
maximum averaged Purcell factors is about 30–163 for sinusoidal shaped Cu-Si$_{3}$
N$_{4}$ grating. It is proved that copper can be adopted to enhance the SE of Si-NCs.
Since copper is the most commonly adopted metal for silicon integrated-circuit
manufacturing, such results pave a promising way for integrating Si emitters on
microelectronics chips.
© 2010 IEEE
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