Abstract
The six-port reflectometer technique enables simple and accurate
measurement of optical reflection coefficients in both magnitude and phase.
The reflection coefficient is computed from four power measurements of
linear combinations of the waves incident and reflected from the device
under test. While the six-port technique is very successful at microwave
frequencies and conceptually related to coherent optical phase diversity
receivers, no optical implementations have been reported so far. In this
paper, we present an experimental characterization of an optical six-port
reflectometer composed of three multimode interference couplers, fabricated
with a single etch step in silicon on insulator. Measurements are performed
using a novel technique with a simple setup. The six-port combines the
incident and reflected waves with magnitude and phase errors less than ${\pm}0.5$ dB and ${\pm}6^\circ$ in the 1485–1575nm
band.
© 2009 IEEE
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription