Abstract
We theoretically study the group-delay characteristics of a silicon
microring resonator based on the coupled mode theory, and experimentally demonstrate
error-free operations of an on-chip delay line using a silicon-on-insulator
(SOI) microring resonator with a 20-$\mu{\hbox
{m}}$ radius. Four signals of different modulation formats
are examined at 5 Gb/s, including return-to-zero (RZ), carrier-suppressed
return-to-zero (CSRZ), return-to-zero duobinary (RZ-DB), and return-to-zero
alternate-mark-inversion (RZ-AMI). Bit error rate (BER) measurements show
that the maximal delay times with error-free operations are 80, 95, 110, and
65 ps, respectively, corresponding to a fractional group delay of $\sim$0.4, $\sim$0.5, $\sim$0.55, and $\sim$0.35. The differences
in delay and signal degradations have been investigated based on the signal
spectra and pattern dependences. Although the delays are demonstrated in a
single ring resonator, the analysis is applicable in slow-light resonance
structures such as all-pass filters (APF) and coupled resonator optical waveguides
(CROW).
© 2008 IEEE
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